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Tests for voltage input thresholds can be used to make important distinctions about the characteristics of a device during validation, as well as the quality of a device during production test.These tests can be conducted on a wide range of devices from semiconductor chips to fully integrated consumer electronics devices.This paper will describe the process of testing the voltage input thresholds on a packaged semiconductor chip.The essential connections for performing voltage input tests using this PXI system are as follows: the PXIe-4141 must be connected to the V terminals of the chip to provide power, and 1) the SMU channel testing the pin must be connected to the pin either directly or through a switch, or 2) the PXIe-6556 must be connected to the digital lines to be tested.Ventura is 29 miles from Residence Inn Los Angeles Westlake, and Hollywood is 27 miles away. Couples in particular like the location – they rated it 8.6 for a two-person trip.

To learn more about the software components of this test system, click here.

The configuration shown above shows how both the PXIe-414x SMUs or PXIe-6556 PPMU can be used as the voltage source for pin under test.

Like the other PC parametric tests, if the SMU is used for this test, the PXI-2535 matrix will be required to switch the SMU line to the appropriate pin to be tested.

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To return to the DC Parametric Validation Reference Architecture main page, click here.

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